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Microwave interferometry: application to precision measurements and noise reduction techniques

机译:微波干涉法:应用于精密测量和降噪技术

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摘要

A concept of interferometric measurements has been applied to the development of ultra-sensitive microwave noise measurement systems. These systems are capable of reaching a noise performance limited only by the thermal fluctuations in their lossy components. The noise floor of a real time microwave measurement system has been measured to be equal to -193 dBc/Hz at Fourier frequencies above 1 kHz. This performance is 40 dB better than that of conventional systems and has allowed the first experimental evidence of the intrinsic phase fluctuations in microwave isolators and circulators. Microwave frequency discriminators with interferometric signal processing have proved to be extremely effective for measuring and cancelling the phase noise in oscillators. This technique has allowed the design of X-band microwave oscillators with a phase noise spectral density of order -150 dBc/Hz at 1 kHz Fourier frequency, without the use of cryogenics. Another possible application of the interferometric noise measurements systems include "flicker noise-free" microwave amplifiers and advanced two oscillator noise measurement systems.
机译:干涉测量的概念已应用于超灵敏微波噪声测量系统的开发。这些系统能够达到仅受其有损组件的热波动限制的噪声性能。在高于1 kHz的傅立叶频率下,实时微波测量系统的本底噪声已测得等于-193 dBc / Hz。该性能比传统系统好40 dB,并为微波隔离器和环行器的固有相位波动提供了第一个实验证据。事实证明,具有干涉信号处理功能的微波鉴频器对于测量和消除振荡器中的相位噪声非常有效。这项技术已允许设计X波段微波振荡器,在1 kHz傅立叶频率下具有-150 dBc / Hz量级的相位噪声频谱密度,而无需使用低温技术。干涉式噪声测量系统的另一种可能的应用包括“无闪烁噪声”微波放大器和先进的两个振荡器噪声测量系统。

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