Mechanical properties and fault analysis of D-slot carded compact yarn

著录项

• 来源
  《Indian Journal of Fibre & Textile Research》 |2009年第3期|225-230|共6页
• 作者

  R Loganathan; C B Lakshmikantha; T Ramachandran;

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• 作者单位

  Department of Textile Technology, K S R College of Technology, Tiruchengode 637 215, India;

  Department of Textile Technology, K S R College of Technology, Tiruchengode 637 215, India;

  Department of Textile Technology, P S G College of Technology, Coimbatore 641 004, India;

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• 收录信息 美国《生物学医学文摘》(MEDLINE);
• 原文格式 PDF
• 正文语种 eng
• 中图分类
• 关键词

  D-slot carded compact yarn; elongation; long thick faults; long thin faults; regular carded compact yarn; regular carded ring yarn; short thick faults; tenacity; yarn hairiness; yarn imperfections;

  机译：D槽梳理紧密纱;伸长;长而厚的断层;长的薄断层;普通梳理紧密纱;普通梳理环锭纱;短而厚的断层;韧性;毛羽纱疵;