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首页> 外文期刊>Indian Journal of Pure & Applied Physics >On sample holder corrections in the complex impedance analysis of electronic ceramics
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On sample holder corrections in the complex impedance analysis of electronic ceramics

机译：电子陶瓷复阻抗分析中的样品架校正

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摘要

A method for applying sample holder corrections in complex impedance analysis of electronic ceramics has been presented. The impedance behaviour of the sample holder assembly has been studied and an equivalent circuit and a function representing the experimental data have been obtained by graphical and complex non-linear least square (CNLS) methods. This function and the values calculated from this are used to remove the sample holder contribution from the experimentally measured impedance values of electronic ceramics. The corrected data, in turn, is used to determine the parameters of the model equivalent circuit representing the electrical behaviour of grains, grain-boundaries and electrode contributions in the ceramic materials. The complex impedance data on La_(0.30)Na_(0.70)Co_(0.30)Nb_(0.70)O_3 has been analysed following this procedure.
机译：提出了一种在电子陶瓷的复阻抗分析中应用样品架校正的方法。已经研究了样品架组件的阻抗特性，并通过图形化和复杂的非线性最小二乘（CNLS）方法获得了等效电路和代表实验数据的函数。此功能和由此计算出的值可用于从电子陶瓷的实验测量阻抗值中删除样品架的贡献。校正后的数据又用于确定模型等效电路的参数，该模型表示陶瓷材料中晶粒，晶粒边界和电极贡献的电学行为。按照此步骤分析了La_（0.30）Na_（0.70）Co_（0.30）Nb_（0.70）O_3上的复阻抗数据。

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