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Rainflow Algorithm-Based Lifetime Estimation of Power Semiconductors in Utility Applications

机译:基于雨流算法的电力半导体寿命估算

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摘要

Rainflow algorithms are one of the popular counting methods used in fatigue and failure analysis in conjunction with semiconductor lifetime estimation models. However, the rainflow algorithm used in power semiconductor reliability does not consider the time-dependent mean temperature calculation. The equivalent temperature calculation proposed by Nagode is applied to semiconductor lifetime estimation in this paper. A month-long arc furnace load profile is used as a test profile to estimate temperatures in insulated-gate bipolar transistors (IGBTs) in a STATCOM for reactive compensation of load. The degradation in the life of the IGBT power device is predicted based on time-dependent temperature calculation.
机译:雨流算法是与半导体寿命估计模型一起用于疲劳和故障分析的流行计数方法之一。但是,用于功率半导体可靠性的雨流算法没有考虑时间相关的平均温度计算。 Nagode提出的等效温度计算被用于半导体寿命估计。一个月的电弧炉负载曲线用作测试曲线,以估算STATCOM中绝缘栅双极晶体管(IGBT)的温度,以进行负载的无功补偿。基于随时间变化的温度计算,可以预测IGBT功率器件的寿命降低。

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