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首页> 外文期刊>Inorganic materials >Graphite Intercalation in the Graphite-H_2SO_4-R (R = H_2O, C_2H_5OH, C_2H_5COOH) Systems
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Graphite Intercalation in the Graphite-H_2SO_4-R (R = H_2O, C_2H_5OH, C_2H_5COOH) Systems

机译：石墨-H_2SO_4-R（R = H_2O，C_2H_5OH，C_2H_5COOH）系统中的石墨嵌入

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The electrochemical behavior of graphite in polar solvent-H_2SO_4 electrolytes is studied in a wide range of H_2SO_4 concentrations. The results demonstrate that, with decreasing H_2SO_4 concentration, the charging curves become smoother and shift to higher potentials, the stage index increases, and intercalation compounds are more difficult to obtain. At H_2SO_4 concentrations of 50% and lower, graphite polarization is accompanied by a significant overoxidation, as evidenced by the anomalously small intercalate layer thicknesses: 7.75-7.85 A. Anodic polarization of graphite in electrolytes consisting of H_2SO_4 and a polar solvent (H_2O and C_2H_5OH) follows the same mechanism as in the case of the formation of graphite bisulfate. In going from water to C_2H_5OH, a less polar solvent, the intercalation threshold increases from 30 to 70% H_2SO_4. It is shown using a set of characterization techniques that, in the graphite-H_2SO_4-R (R = H_2O, C_2H_5OH) systems, the solvent is not intercalated into graphite. Stage Ⅰ-Ⅲ ternary graphite intercalation compounds (TGICs) are synthesized for the first time in the graphite-H_2SO_4-C_2H_5COOH system: stage Ⅰ TGICs at H_2SO_4 concentrations above 70%, stage Ⅱ in the range 30-70% H_2SO_4, and stage Ⅲ at H_2SO_4 concentrations down to 10%. The intercalate layer thickness in the TGICs is 7.94 A. The mechanism of TGIC formation in this system is shown to differ from those in mixtures of H_2SO_4 and other organic acids. Thermal analysis in combination with spectroscopic analysis of gaseous products provides clear evidence for intercalation of propionic acid into the TGIC and indicates that the thermal stability of this compound is lower than that of graphite bisulfate.
机译：研究了在宽浓度的H_2SO_4中，石墨在极性溶剂H_2SO_4电解质中的电化学行为。结果表明，随着H_2SO_4浓度的降低，带电曲线变得更平滑并移向更高的电位，阶段指数增加，并且更难以获得插层化合物。在H_2SO_4浓度为50％或更低的情况下，石墨极化伴随着明显的过氧化，如异常小的插层层厚度：7.75-7.85 A所证明。由H_2SO_4和极性溶剂（H_2O和C_2H_5OH）组成的电解质中石墨的阳极极化）的机理与形成硫酸氢硫酸根的机理相同。从水变成极性较小的溶剂C_2H_5OH时，插层阈值从30％H_2SO_4增加到70％。使用一组表征技术显示，在石墨-H_2SO_4-R（R = H_2O，C_2H_5OH）系统中，溶剂未插入石墨中。在石墨-H_2SO_4-C_2H_5COOH系统中首次合成了Ⅰ-Ⅲ期三元石墨插层化合物（TGIC）：H_2SO_4浓度高于70％的Ⅰ阶段TGIC，Ⅱ在30-70％H_2SO_4范围内的Ⅱ阶段在H_2SO_4浓度下降至10％。 TGIC中的插层厚度为7.94A。显示该系统中TGIC的形成机理不同于H_2SO_4与其他有机酸的混合物。结合气态产物的光谱分析进行热分析，为丙酸插入TGIC提供了明确的证据，并表明该化合物的热稳定性低于硫酸氢石墨。

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