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首页> 外文期刊>Instrumentation and Measurement, IEEE Transactions on >Differential$E$-Field Coupling to Shielded$H$-Field Probe in Near-Field Measurements and a Suppression Approach
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Differential$E$-Field Coupling to Shielded$H$-Field Probe in Near-Field Measurements and a Suppression Approach

机译：差分 $ E $ -场耦合到屏蔽 $ H $ -近场测量中的场探针及其抑制方法

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摘要

In near-held scanning using H-held probes, E-held coupling is a major concern. E-held suppression performance must be characterized before an H-held probe can be used for near-held scanning. Common method of measurement involves measuring the E-held coupling in the same location where the strongest H-held coupling occurs. In microstrip line traces, it is assumed that this occurs right above the center of the trace and less coupling at all other locations across the microstrip line. In this paper, we show that the maximum E-held coupling occurs at a location slightly offset from the trace center. The E-held coupling to a shielded H-held probe at such a position leads to differential-mode coupling, which the standard shield of an H-held probe is unable to suppress. The coupling mechanism is investigated and a differential E-held coupling suppression approach is proposed. For the H-held probe used in this paper, a proposed floating plate is shown to improve the measured E-held suppression ratio by a factor of 18 dB compared to a similar probe without this modihcation.
机译：在使用H型探头进行近距离扫描时，E型耦合是一个主要问题。必须先对电子保持抑制性能进行表征，然后才能将H保持探头用于近距离保持扫描。常见的测量方法包括在发生最强H保持耦合的相同位置测量E保持耦合。在微带线走线中，假设这发生在走线中心的正上方，并且在微带线的所有其他位置的耦合较少。在本文中，我们表明，最大的E保持耦合发生在距走线中心略微偏移的位置。 E保持耦合到屏蔽H保持探头的位置会导致差模耦合，H保持探头的标准屏蔽无法抑制这种差模耦合。研究了耦合机制，提出了差分电子保持耦合抑制方法。对于本文中使用的H保持探头，与没有这种修改的类似探头相比，建议的浮板显示出将测得的E保持抑制比提高了18 dB。

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  • 来源
  • 作者

    Sen Yang; Qiaolei Huang; Guanghua Li; Reza Zoughi; David J. Pommerenke;

  • 作者单位

    Electrical and Computer Engineering Department, Electromagnetic Compatibility Laboratory, Missouri University of Science and Technology, Rolla, MO, USA;

    Electrical and Computer Engineering Department, Electromagnetic Compatibility Laboratory, Missouri University of Science and Technology, Rolla, MO, USA;

    Electrical and Computer Engineering Department, Electromagnetic Compatibility Laboratory, Missouri University of Science and Technology, Rolla, MO, USA;

    Electrical and Computer Engineering Department, Applied Microwave Nondestructive Testing Laboratory, Missouri University of Science and Technology, Rolla, MO, USA;

    Electrical and Computer Engineering Department, Electromagnetic Compatibility Laboratory, Missouri University of Science and Technology, Rolla, MO, USA;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    Probes; Couplings; Microstrip components; Atmospheric modeling; Substrates; Dielectrics;

    机译：探针;耦合;微带元件;大气建模;基板;电介质;

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