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首页> 外文期刊>International journal of electronics >OBIST methodology incorporating modified sensitivity of pulses for active analogue filter components
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OBIST methodology incorporating modified sensitivity of pulses for active analogue filter components

机译：OBIST方法论结合了对有源模拟滤波器组件的脉冲灵敏度的改进

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In this paper, oscillation-based built-in self-test method is used to diagnose catastrophic and parametric faults in integrated circuits. Sallen-Key low pass filter and high pass filter circuits with different gains are used to investigate defects. Variation in seven parameters of operational amplifier (OP-AMP) like gain, input impedance, output impedance, slew rate, input bias current, input offset current, input offset voltage and catastrophic as well as parametric defects in components outside OP-AMP are introduced in the circuit and simulation results are analysed. Oscillator output signal is converted to pulses which are used to generate a signature of the circuit. The signature and pulse count changes with the type of fault present in the circuit under test (CUT). The change in oscillation frequency is observed for fault detection. Designer has flexibility to predefine tolerance band of cut-off frequency and range of pulses for which circuit should be accepted. The fault coverage depends upon the required tolerance band of the CUT. We propose a modification of sensitivity of parameter (pulses) to avoid test escape and enhance yield. Result shows that the method provides 100% fault coverage for catastrophic faults.
机译：本文采用基于振荡的内置自检方法来诊断集成电路中的灾难性和参数性故障。具有不同增益的Sallen-Key低通滤波器和高通滤波器电路用于研究缺陷。介绍了运算放大器（OP-AMP）的七个参数的变化，例如增益，输入阻抗，输出阻抗，压摆率，输入偏置电流，输入失调电流，输入失调电压和灾难性变化，以及OP-AMP外部组件的参数缺陷在电路中，并分析了仿真结果。振荡器输出信号被转换为脉冲，用于产生电路信号。签名和脉冲计数随被测电路（CUT）中出现的故障类型而变化。观察振荡频率的变化以进行故障检测。设计人员可以灵活地预定义应接受电路的截止频率和脉冲范围的公差带。故障范围取决于CUT所需的公差带。我们建议修改参数（脉冲）的灵敏度，以避免测试逃逸并提高产量。结果表明，该方法可为灾难性故障提供100％的故障覆盖率。

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