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首页> 外文期刊>International Journal of Heat and Mass Transfer >Total hemispherical apparent radiative properties of the infinite V-groove with specular reflection
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Total hemispherical apparent radiative properties of the infinite V-groove with specular reflection

机译：镜面反射的无限V形槽的总半球视在辐射特性

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摘要

Multiple reflections in a cavity geometry augment the emission and absorption of the cavity opening relative to a flat surface in a phenomenon known as the cavity effect. The extent of the cavity effect is quantified using apparent absorptivity and apparent emissivity. Analysis of complicated thermal systems is simplified through application of apparent radiative properties to cavity geometries. The apparent radiative properties of a specularly-reflecting, gray, isothermal V-groove have been derived analytically, but these results have not been validated experimentally or numerically. Additionally, the model for apparent absorptivity of an infinite V-groove subjected to partial illumination in the presence of collimated irradiation is not available. In this work, the following existing models for a specularly-reflecting V-groove are collected into a single source: (1) the apparent absorptivity of a diffusely irradiated V-groove, (2) the apparent emissivity of an isothermal V-groove and (3) the apparent absorptivity of a V-groove subject to collimated irradiation with full-illumination. Further, a new analytical model is developed to predict the apparent absorptivity of an infinite V-groove subject to collimated irradiation with partial illumination. A custom, Monte Carlo ray tracing solver is used to predict the apparent radiative properties for all cases as a means of numerical verification by comparing the ray tracing data with the results from the new model in this work and the previously existing models. For diffuse irradiation, the analytical model and ray tracing data show excellent agreement with an average discrepancy of 4.4 x 10(-4), verifying the diffuse-irradiation analytical model. Similar agreement is found for collimated irradiation, where the full and partial illumination models indicate average discrepancies of 4.9 x 10(-4) and 4.6 x 10(-4) when compared with ray tracing data. (C) 2018 Elsevier Ltd. All rights reserved.
机译：空腔几何结构中的多次反射会增加空腔开口相对于平坦表面的发射和吸收，这是一种称为空腔效应的现象。使用表观吸收率和表观发射率来量化腔效应的程度。通过将明显的辐射特性应用于腔体几何形状，简化了复杂热系统的分析。镜面反射的灰色等温V型槽的表观辐射特性已通过分析得出，但这些结果尚未通过实验或数值验证。此外，在存在准直辐射的情况下经过部分照明的无限V形沟槽的表观吸收率模型不可用。在这项工作中，将以下现有的镜面反射V型槽模型收集到一个源中：（1）漫辐射V型槽的表观吸收率，（2）等温V型槽的表观发射率，以及（3）在全光照条件下准直照射的V型槽的表观吸收率。此外，开发了一种新的分析模型来预测无限准V形槽在部分照明条件下的准直照射下的表观吸收率。通过将射线追踪数据与本工作中新模型和先前模型的结果进行比较，使用了定制的蒙特卡洛射线追踪求解器来预测所有情况下的视在辐射特性，以此作为数值验证的手段。对于漫辐射，分析模型和射线跟踪数据显示出极好的一致性，平均差异为4.4 x 10（-4），从而验证了漫辐射分析模型。对于准直照射，发现了相似的协议，其中与光线跟踪数据相比，全部和部分光照模型表明平均差异为4.9 x 10（-4）和4.6 x 10（-4）。 （C）2018 Elsevier Ltd.保留所有权利。

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