On the evaluation of the high-frequency load line in active devices

著录项

• 来源
  《International Journal of Microwave and Wireless Technologies》 |2011年第1期|p.19-24|共6页
• 作者

  ANTONIO RAFFO; GUSTAVO AVOLIO; DOMINIQUE M.M.-P. SCHREURS; SERGIO DI FALCO; VALERIA VADALA; FRANCESCO SCAPPAVIVA; GIOVANNI CRUPI; BART NAUWELAERS; AND GIORGIO VANNINI;

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• 作者单位

  Department of Engineering, University of Ferrara, Via Saragat 1, 44122 Ferrara,Italy;

  Electronic Engineering Department, Katholieke Universiteit Leuven, B-3001 Leuven, Belgium;

  Electronic Engineering Department, Katholieke Universiteit Leuven, B-3001 Leuven, Belgium;

  Department of Engineering, University of Ferrara, Via Saragat 1, 44122 Ferrara,Italy;

  Department of Engineering, University of Ferrara, Via Saragat 1, 44122 Ferrara,Italy;

  Microwave Electronics for Communications (MEC) Srl, 40123 Bologna, Italy;

  Dipartimento di Fisica della Materia e Ingegneria Elettronica, University of Messina, 98166 Messina, Italy;

  Electronic Engineering Department, Katholieke Universiteit Leuven, B-3001 Leuven, Belgium;

  Department of Engineering, University of Ferrara, Via Saragat 1, 44122 Ferrara,Italy;

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• 收录信息
• 原文格式 PDF
• 正文语种 eng
• 中图分类
• 关键词

  integrated-circuit design; microwave amplifiers; semiconductor device measurements; semiconductor device modeling; time-domain measurements;

  机译：集成电路设计;微波放大器半导体器件测量;半导体器件建模;时域测量;