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首页> 外文期刊>International Journal of Production Research >A broader view of the economic design of the X-bar chart in the semiconductor industry
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A broader view of the economic design of the X-bar chart in the semiconductor industry

机译：半导体行业X线图的经济设计的更广阔视野

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摘要

This paper starts from a notice made in the semiconductor industry: a process control system and especially control charts provide information that can be exploited for correlation analyses during process investigations. In this industry, key and costly investigations are made for improving yield and reducing scrap. Daily, engineering teams are working at manufacturing improvements. Without process data, their work could take much more time and lead to weak improvements. Nevertheless, design of process control systems and in particular control charts lacks from taking into account this remark as there is no sound application to infer an optimal control chart depending on business parameters like yield, scrap, customer audits, etc. Meetings between several engineering teams (process control, quality, process integration, industrial engineering and production) occur frequently to find an affordable quantity of controls for each operation. The literature point of view does not provide more recommendations to take into account the reuse of data into these costly investigations. The paper investigates this issue. For this first investigation, work has been focused on the design economics of control charts for a simplified process model. The paper translates this concept into the Lorenzen and Vance's (1986) model. It simulates the design economic of a control chart taking into account this new model and infers new optimal statistical process control (SPC) set points. An analysis of this new link is made in a context of yield improvement, providing reference for knowing optimal quantity and frequency of controls.
机译：本文从半导体行业的公告开始：过程控制系统，尤其是控制图提供了可在过程研究过程中用于相关性分析的信息。在该行业中，进行了关键且昂贵的研究，以提高产量并减少废品。每天，工程团队都在进行制造改进。没有过程数据，他们的工作可能会花费更多时间，并导致改进不力。尽管如此，过程控制系统的设计，尤其是控制图，也没有考虑到这一点，因为没有可靠的应用程序可以根据产量，报废，客户审计等业务参数来推断最佳控制图。几个工程团队之间的会议（过程控制，质量，过程集成，工业工程和生产）经常出现，以便为每个操作找到负担得起的控制量。文献的观点没有提供更多建议来考虑将数据重用于这些昂贵的调查中。本文对此问题进行了调查。对于此首次调查，我们的工作重点放在简化过程模型的控制图设计经济学上。本文将这一概念转化为Lorenzen和Vance（1986）的模型。考虑到新模型，它可以模拟控制图的设计经济性，并推断出新的最佳统计过程控制（SPC）设定点。在提高产量的背景下对这一新环节进行了分析，为了解最佳控制量和频率提供了参考。

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  • 来源
    《International Journal of Production Research》 |2010年第20期|P.5843-5857|共15页
  • 作者

    B. Baud-Lavigne; S. Bassetto; B. Penz;

  • 作者单位

    Department of Industrial Engineering, Grenoble Institute of Technology, 46 Avenue Felix Viallet, 38000 Grenoble, France;

    Department of Industrial Engineering, Grenoble Institute of Technology, 46 Avenue Felix Viallet, 38000 Grenoble, France;

    Department of Industrial Engineering, Grenoble Institute of Technology, 46 Avenue Felix Viallet, 38000 Grenoble, France;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    economic design of control chart; scrap investigation; learning; ramp-up;

    机译：控制图的经济设计;废品调查;学习;斜坡上升;

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