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Development of an optimal measuring device selection system using neural networks

机译:利用神经网络开发最佳测量设备选择系统

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摘要

An optimal measuring device selection system using neural networks is proposed. There are two major steps. First, the measuring information such as curvature, normal, type of surface, edge and facet approximation is extracted from the computer-aided design model. Second, the best suitable measuring device is determined using the neural network system based on the knowledge of the measuring parameters and measuring resources. An example of machine selection is implemented to evaluate the performance of the system.
机译:提出了一种使用神经网络的最优测量设备选择系统。有两个主要步骤。首先,从计算机辅助设计模型中提取测量信息,例如曲率,法线,表面类型,边缘和小平面近似值。其次,根据测量参数和测量资源的知识,使用神经网络系统确定最合适的测量设备。实施了机器选择的示例以评估系统的性能。

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