首页> 外文期刊>International journal of quality, statistics, & reliability >Optimum Time-Censored Constant-Stress PALTSP for the Burr Type Ⅻ Distribution Using Tampered Failure Rate Model
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Optimum Time-Censored Constant-Stress PALTSP for the Burr Type Ⅻ Distribution Using Tampered Failure Rate Model

机译:使用篡改故障率模型的Burr Failure分布最优时间校正恒应力PALTSP

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摘要

This paper presents optimum design of time-censored constant-stress partially accelerated life test sampling plan (PALTSP) in which each item runs either at use or at accelerated conditions and product life follows Burr type Ⅻ. The optimal plan consists in finding out sample proportions allocated to both use and accelerated conditions by minimizing the asymptotic variance of test statistic for deciding on acceptance/rejection of the lot such that producer's and consumer's interests are safeguarded. The method developed has been illustrated using an example. Sensitivity analysis has also been carried out.
机译:本文提出了时间限制的恒应力部分加速寿命试验采样计划(PALTSP)的最佳设计,其中每一项在使用或加速条件下运行,产品寿命遵循Burr type类型。最佳计划包括通过最小化检验统计量的渐近方差来找出分配给使用条件和加速条件的样本比例,以便决定批次的接受/拒绝,从而维护生产者和消费者的利益。已通过示例说明了开发的方法。灵敏度分析也已进行。

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