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首页> 外文期刊>International journal of quality, statistics, & reliability >Quality Assessment of Transient Response Analysis Method for Detecting Radiation-Induced Faults
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Quality Assessment of Transient Response Analysis Method for Detecting Radiation-Induced Faults

机译：辐射诱发故障的瞬态响应分析方法的质量评估

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摘要

We evaluate the ability of transient response analysis method (TRAM), a simple test strategy proposed for filters, to detect deviations in circuit specifications beyond established limits. Particularly, we focus our attention on deviations produced by displacement damage in integrated resistors. This damage is produced by the impact of high-energy particles like the encountered in space environments. For this purpose, we formulate a simple deviation-fault model that takes into consideration the degradation addressed. Additionally, more transient response parameters are taken into account in order to improve the fault coverage. We adopt for our evaluations two typical second-order filters as cases of study. For these filters, the simulation results show that TRAM reaches excellent fault coverage for both filters, suggesting that its use in space applications is encouraging.
机译：我们评估瞬态响应分析方法（TRAM）的能力，瞬态响应分析方法（TRAM）是为滤波器提出的一种简单测试策略，用于检测超出既定限制的电路规格偏差。特别是，我们将注意力集中在集成电阻的位移损坏产生的偏差上。这种损坏是由高能粒子的撞击产生的，就像在太空环境中遇到的一样。为此，我们制定了一个简单的偏差-故障模型，该模型考虑了所解决的退化问题。此外，为了提高故障覆盖率，还考虑了更多的瞬态响应参数。我们将两个典型的二阶滤波器作为研究案例进行评估。对于这些滤波器，仿真结果表明，TRAM对两个滤波器均具有出色的故障覆盖率，这表明在空间应用中使用TRAM令人鼓舞。

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    Jose Peralta; Gabriela Peretti; Eduardo Romero; Gustavo Demarco; Carlos Marques;

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    Mechatronics Research Group, Universidad Tecnoldgica National, Avenida Universidad 450, 5900 Villa Maria, Argentina;

    Mechatronics Research Group, Universidad Tecnoldgica National, Avenida Universidad 450, 5900 Villa Maria, Argentina;

    Mechatronics Research Group, Universidad Tecnoldgica National, Avenida Universidad 450, 5900 Villa Maria, Argentina;

    Mechatronics Research Group, Universidad Tecnoldgica National, Avenida Universidad 450, 5900 Villa Maria, Argentina;

    Electronics and Instrumentation Development Group, Universidad National de Cordoba, Medina Allende S/N,5000 Cdrdoba, Argentina;

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