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An Ultrawideband SPST Switch Using Defected Ground Structure Low Pass Filter in 65-nm CMOS Technology

机译:采用65nm CMOS技术中的缺陷接地结构低通滤波器的超宽带SPST开关

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摘要

In this article, we propose a novel concept of applying a defected groundrnstructure low pass filter (DGS LPF) to the design of switches. We highlight that the DGSrnstructure has such advantages as consuming less silicon area and providing another degreernof design freedom to optimize the switch performances. To prove the concept, we analyze,rndesign, and characterize a single-pole single-throw (SPST) switch using a DGS LPF in 65-rnnm CMOS technology. We show that the DGS LPF SPST switch with active size of 125 3rn88 μm2 can cover an ultrawideband from DC to 77 GHz.
机译:在本文中,我们提出了将有缺陷的接地结构低通滤波器(DGS LPF)应用到开关设计的新颖概念。我们着重指出DGSrn结构具有以下优势:消耗更少的硅面积,并提供另一度的设计自由度以优化开关性能。为了证明这一概念,我们使用65nmnm CMOS技术的DGS LPF分析,设计和表征单刀单掷(SPST)开关。我们显示DGS LPF SPST开关的有效尺寸为125 3rn88μm2,可以覆盖从DC到77 GHz的超宽带。

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