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On the thru-reflect-line (TRL) numerical calibration and error analysis for parameter extraction of circuit model

机译:通过反射线(TRL)数值校准和误差分析以提取电路模型的参数

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摘要

In this work, a resistor standard is introduced into our previously proposed numerical thru-reflect-line (TRL) calibration procedure in order to determine the characteristic impedance of the line standard of calibration on the basis of a deterministic method of moments (MoM) algorithm. A comprehensive analytical derivation is presented with regards to electrical properties of such a resistor standard in comparison to other standards. In addition, an error analysis is detailed, which reveals correlations of characteristic parameters in connection with equivalent circuit model development from the conversions from field-based S-parameters to circuit-based Y- or Z-parameters. Interesting properties and criteria are derived, allowing accurate parameter extractions. To validate the proposed numerical TRL calibration procedure with this new resistor standard concept and the developed error analysis, the characteristic impedance of a microstrip line is extracted from a commercial software. In addition, a further example with microstrip discontinuity is shown and the effectiveness of the proposed technique is verified. (c) 2006 Wiley Periodicals, Inc.
机译:在这项工作中,将电阻器标准引入我们先前提出的数值直通反射线(TRL)校准程序中,以便基于确定性矩(MoM)算法确定校准线标准的特性阻抗。与其他标准相比,针对这种电阻器标准的电性能,提出了全面的分析推导。此外,还进行了详细的误差分析,揭示了与等效电路模型开发相关的特性参数的相关性,这些等效电路模型从基于现场的S参数转换为基于电路的Y或Z参数。得出有趣的属性和标准,从而可以精确提取参数。为了用这个新的电阻器标准概念和开发的误差分析来验证拟议的数字TRL校准程序,从商业软件中提取了微带线的特征阻抗。此外,还显示了具有微带间断的另一个示例,并验证了所提出技术的有效性。 (c)2006年Wiley Periodicals,Inc.

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