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首页> 外文期刊>JSME International Journal. Series B, Fluids and Thermal Engineering >Thermal Radiation Spectroscopy Diagnosis for Temperature and Microstructure of Surfaces
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Thermal Radiation Spectroscopy Diagnosis for Temperature and Microstructure of Surfaces

机译:表面温度和微观结构的热辐射光谱诊断

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摘要

Surface microstates of real surfaces of solid materials change in industrial environments, or they are changed in industrial surface processes positively. A real time diagnosis technique for the surface microstates should be developed for the process control. We propose a diagnosis technique for temperature and microstructure of real surfaces on a basis of the hardware performance of our wide-spectral-range highspeed spectrophotometer system. With respect to the temperature, an active spectral pyrometer technique is adopted, in which the reflection of the surface is measured as well as the self-emission. With respect to the microstructure, an attention is paid to the interference and diffraction of radiation in a new real surface model. An experiment is made on a metal surface in a high-temperature air-oxidation process to verify the performance of this technique. Spectra of emission and reflection energy of radiation in a near-infrared through infrared region are measured at every 2 s, and analyzed. Time transition of the surface temperature of an order of 1100 K is estimated within an inaccuracy of 10 K. The average thickness d and rms roughnessσ{sub}I of the surface film are estimated to be in regions of d=0.08~3.8μm and σ{sub}I=0.01~0.71μm, respectively.
机译:固体材料真实表面的表面微状态在工业环境中会发生变化,或者在工业表面过程中会发生正向变化。应该开发用于表面微状态的实时诊断技术以进行过程控制。我们基于广谱高速分光光度计系统的硬件性能,提出了一种针对实际表面的温度和微观结构的诊断技术。关于温度,采用了主动光谱高温计技术,其中测量了表面的反射以及自发光。关于微观结构,在新的真实表面模型中要注意辐射的干涉和衍射。在高温空气氧化过程中对金属表面进行了实验,以验证该技术的性能。每2秒钟测量一次近红外到红外区域中辐射的发射和反射能谱,并进行分析。估计表面温度随时间的变化为1100 K,误差为10K。表面膜的平均厚度d和均方根粗糙度σ{sub} I估计在d = 0.08〜3.8μm的范围内, σ{sub} I分别为0.01〜0.71μm。

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