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首页> 外文期刊>ISIJ international >Glow Discharge Optical Emission Spectrometry on the Formation of Thin Oxide Layers on the Iron Binary Alloy Surface
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Glow Discharge Optical Emission Spectrometry on the Formation of Thin Oxide Layers on the Iron Binary Alloy Surface

机译：辉光放电光发射光谱法在铁二元合金表面形成薄氧化物层

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摘要

Glow discharge optical emission spectrometry (GDOS) has been used for characterizing thin oxide layers formed on iron-base binary alloys with aluminum, silicon, phosphorus, chromium, manganese, nickel and molybdenum by heating in air at 773 and 873 K. We focused on the enrichment of alloying elements in the thin oxide layers and substrates as well as the effect of alloying elements on the thickness of the oxide layers. It was found in the quantitative depth profiles that aluminum, silicon, phosphorus, chromium and nickel are enriched at the oxide/metal interface, while manganese is distributed to the oxide layer and molybdenum is observed neither at the oxide/metal interface nor in the oxide layer. It is also suggested that aluminum, silicon, chromium and molybdenum have a significant influence on the reduction in the thickness of the oxide layers, and the present results are in good agreement with structural data obtained by X-ray diffraction.
机译：辉光放电光发射光谱法（GDOS）用于表征在铝，硅，磷，铬，锰，镍和钼的铁基二元合金上通过在773和873 K的空气中加热而形成的薄氧化物层。合金元素在薄氧化物层和基底中的富集以及合金元素对氧化物层厚度的影响。在定量深度分布图中发现，铝，硅，磷，铬和镍在氧化物/金属界面富集，而锰分布在氧化物层上，钼在氧化物/金属界面和氧化物中均未观察到层。还建议铝，硅，铬和钼对减少氧化物层的厚度有显着影响，并且当前结果与通过X射线衍射获得的结构数据高度吻合。

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