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首页> 外文期刊>Japanese journal of applied physics >Two-Dimensional Soft Output Viterbi Algorithm with a Variable Reliability Factor for Holographic Data Storage
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Two-Dimensional Soft Output Viterbi Algorithm with a Variable Reliability Factor for Holographic Data Storage

机译：具有可变可靠性因子的二维软输出维特比算法用于全息数据存储

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摘要

In a practical holographic data storage system, the reconstruction process for a data page should account for the processing time as well as the bit error rate (BER) performance. To improve both aspects, we introduce two-dimensional (2D) partial response maximum likelihood composed of a 2D partial response (PR) target including diagonal elements and a 2D soft output Viterbi algorithm (SOVA) with a variable reliability factor. The 2D SOVA performs two one-dimensional (1D) SOVAs in structural accordance with the 2D PR target where extrinsic information uses the expected value calculated on a synchronization pattern. Finally, the 2D SOVA exports a weighted average using the reliability factor that is updated similarly as the optimization scheme for each page. The simulation results show that the proposed method has superior BER performance, despite using only two 1D SOVAs as compared with the modified 2D SOVA composed of four 1D SOVAs.
机译：在实际的全息数据存储系统中，数据页的重建过程应考虑处理时间以及误码率（BER）性能。为了改善这两个方面，我们引入了二维（2D）部分响应最大似然度，该概率由包含对角元素的2D部分响应（PR）目标和具有可变可靠性因子的2D软输出维特比算法（SOVA）组成。 2D SOVA根据2D PR目标在结构上执行两个一维（1D）SOVA，其中外部信息使用在同步模式上计算的期望值。最后，二维SOVA使用与每个页面的优化方案类似更新的可靠性因子导出加权平均值。仿真结果表明，与仅由两个1D SOVA组成的改进型2D SOVA相比，尽管仅使用两个1D SOVA，但该方法仍具有出色的BER性能。

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  • 来源
    《Japanese journal of applied physics》 |2013年第9issue3期|09LE03.1-09LE03.5|共5页
  • 作者

    Keunhwi Koo; Soo-Yong Kim; Jae Jin Jeong; Sang Woo Kim;

  • 作者单位

    Department of Electrical Engineering, Pohang University of Science and Technology (POSTECH), Pohang, Gyeongbuk 790-784, Korea;

    Department of Electrical Engineering, Pohang University of Science and Technology (POSTECH), Pohang, Gyeongbuk 790-784, Korea,M&C Development Team, System LSI Division, Samsung Electronics Co., Ltd., Yongin, Gyeonggi 446-711, Korea;

    Department of Electrical Engineering, Pohang University of Science and Technology (POSTECH), Pohang, Gyeongbuk 790-784, Korea;

    Department of Electrical Engineering, Pohang University of Science and Technology (POSTECH), Pohang, Gyeongbuk 790-784, Korea,Department of Creative IT Excellence Engineering and Future IT Innovation Laboratory,Pohang University of Science and Technology (POSTECH), Pohang, Gyeongbuk 790-784, Korea;

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