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首页> 外文期刊>Japanese journal of applied physics >High-Density Holographic Data Storage Using Three-Dimensional Shift Multiplexing with Spherical Reference Wave
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High-Density Holographic Data Storage Using Three-Dimensional Shift Multiplexing with Spherical Reference Wave

机译：使用球形参考波的三维位移多路复用进行高密度全息数据存储

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摘要

In this study, we propose a three-dimensional shift multiplexing technique using a spherical reference wave. By utilizing a spherical reference wave, multiplex recording is enabled in this system by simply displacing the recording medium. The utilization of a spherical reference wave makes it possible to realize three-dimensional multiplexing, which uses parallel directions of the medium surface and thickness direction. It is also expected that this approach will improve the recording density as compared with the conventional multiplex technique. We report the numerical and experimental evaluation results of our high-density recording and reproduction system based on this principle.
机译：在这项研究中，我们提出了一种使用球形参考波的三维移位复用技术。通过利用球形参考波，在该系统中通过简单地移动记录介质就可以进行多路记录。球形参考波的利用使得可以实现三维复用，该三维复用使用介质表面的平行方向和厚度方向。还期望与常规的多路复用技术相比，该方法将提高记录密度。我们根据此原理报告了我们的高密度记录和再现系统的数值和实验评估结果。

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  • 来源
    《Japanese journal of applied physics》 |2013年第9issue3期|09LD07.1-09LD07.5|共5页
  • 作者

    Shuhei Yoshida; Hiroyuki Kurata; Shohei Ozawa; Kaito Okubo; Shuma Horiuchi; Zenta Ushiyama; Manabu Yamamoto; Shogo Koga; Asato Tanaka;

  • 作者单位

    Department of Applied Electronics, Tokyo University of Science, Katsushika, Tokyo 125-8585, Japan;

    Department of Applied Electronics, Tokyo University of Science, Katsushika, Tokyo 125-8585, Japan;

    Department of Applied Electronics, Tokyo University of Science, Katsushika, Tokyo 125-8585, Japan;

    Department of Applied Electronics, Tokyo University of Science, Katsushika, Tokyo 125-8585, Japan;

    Department of Applied Electronics, Tokyo University of Science, Katsushika, Tokyo 125-8585, Japan;

    Department of Applied Electronics, Tokyo University of Science, Katsushika, Tokyo 125-8585, Japan;

    Department of Applied Electronics, Tokyo University of Science, Katsushika, Tokyo 125-8585, Japan;

    Mitsubishi Chemical Group Science and Technology Research Center, Inc., Yokohama 227-8502, Japan;

    Mitsubishi Chemical Group Science and Technology Research Center, Inc., Yokohama 227-8502, Japan;

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