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首页> 外文期刊>Japanese journal of applied physics >Observation of n-Type Conduction in Carbon Nanotube Field-Effect Transistors with Au Contacts in Vacuum
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Observation of n-Type Conduction in Carbon Nanotube Field-Effect Transistors with Au Contacts in Vacuum

机译:真空中具有Au触点的碳纳米管场效应晶体管中n型导电的观察

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摘要

The change in the conduction type of carbon nanotube field-effect transistors (CNT-FETs) with Au contacts from p-type to n-type by annealing in vacuum was observed. The result was explained by the local work function change of the Au contacts based on the measurement of the surface potential of the Au/CNT contact by Kelvin probe force microscopy (KFM). This work function change became prominent due to the desorption of oxygen by annealing. The degree of the conduction-type change was found to be dependent on the devices. The CNT-FETs with small OFF current showed clear conduction-type change. However, the devices with large OFF current did not show clear conduction-type change. This device dependent behavior was explained by the energy gap difference among devices, in which suppression of OFF current is not sufficient for the devices with thick CNTs with small bandgap.
机译:通过真空退火,观察到具有Au触点的碳纳米管场效应晶体管(CNT-FET)的导电类型从p型变为n型的变化。结果是通过基于开尔文探针力显微镜(KFM)对Au / CNT触点表面电势的测量得出的,Au触点的局部功函数发生了变化。由于退火引起的氧的解吸,该功函数的变化变得显着。发现导电类型变化的程度取决于器件。关闭电流小的CNT-FET表现出明显的导电类型变化。然而,具有大OFF电流的器件没有显示出明显的导电类型变化。器件之间的能隙差异解释了这种与器件有关的行为,其中对于具有较窄带隙的厚CNT的器件,截止电流的抑制是不够的。

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  • 来源
    《Japanese journal of applied physics》 |2012年第2issue2期|p.02BN06.1-02BN06.4|共4页
  • 作者单位

    Department of Quantum Engineering, Nagoya University, Nagoya 464-8603, Japan;

    Department of Quantum Engineering, Nagoya University, Nagoya 464-8603, Japan Venture Business Laboratory, Nagoya University, Nagoya 464-8603, Japan;

    Department of Quantum Engineering, Nagoya University, Nagoya 464-8603, Japan Venture Business Laboratory, Nagoya University, Nagoya 464-8603, Japan;

    Department of Quantum Engineering, Nagoya University, Nagoya 464-8603, Japan;

    Department of Quantum Engineering, Nagoya University, Nagoya 464-8603, Japan;

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