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首页> 外文期刊>Japanese journal of applied physics >Inverted InAIAs/lnGaAs Avalanche Photodiode with Low-High-Low Electric Field Profile
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Inverted InAIAs/lnGaAs Avalanche Photodiode with Low-High-Low Electric Field Profile

机译:具有低高低电场分布的InAIAs / InGaAs雪崩光电二极管倒置

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摘要

We propose a new p-down inverted avalanche photodiode (APD) structure suitable for a scaled APD with smaller junctions. The inverted APD structure has an edge-field buffer layer to prevent undesirable edge breakdown and suppress the excess surface leakage current associated with the InGaAs mesa surface. The fabricated back-illuminated InAIAs/lnGaAs APDs show excellent multiplication characteristics without edge breakdown. An f_(3db) of 27 GHz and a GB product of 220 GHz are obtained for these APDs.
机译:我们提出了一种新的p-down倒雪崩光电二极管(APD)结构,适用于具有较小结点的按比例缩放的APD。倒置的APD结构具有边缘场缓冲层,以防止不希望的边缘击穿并抑制与InGaAs台面表面相关的过量表面泄漏电流。所制造的背照式InAIAs / InGaAs APD具有出色的倍增特性,而没有边缘击穿。对于这些APD,可获得27 GHz的f_(3db)和220 GHz的GB乘积。

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  • 来源
    《Japanese journal of applied physics》 |2012年第2issue2期|p.02BE03.1-02BE03.4|共4页
  • 作者单位

    NTT Photonics Laboratories, NTT Corporation, Atsugi, Kanagawa 243-0198, Japan;

    NTT Photonics Laboratories, NTT Corporation, Atsugi, Kanagawa 243-0198, Japan;

    NTT Photonics Laboratories, NTT Corporation, Atsugi, Kanagawa 243-0198, Japan;

    NTT Photonics Laboratories, NTT Corporation, Atsugi, Kanagawa 243-0198, Japan;

    NTT Photonics Laboratories, NTT Corporation, Atsugi, Kanagawa 243-0198, Japan;

    NTT Photonics Laboratories, NTT Corporation, Atsugi, Kanagawa 243-0198, Japan;

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