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首页> 外文期刊>Japanese journal of applied physics >Low-Shrinkage Spin-On Glass for Low Parasitic Capacitance Gap-Filling Process in Advanced Memory Devices
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Low-Shrinkage Spin-On Glass for Low Parasitic Capacitance Gap-Filling Process in Advanced Memory Devices

机译:低收缩旋涂玻璃,用于高级存储设备中的低寄生电容间隙填充工艺

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摘要

A new low-dielectric-constant spin-on glass (SOG) with a k value of 2.4 has been developed for a gap-filling process in advanced memory devices. The low-shrinkage characteristic of the SOG during thermal curing provides capabilities of gap filling and planarizing as high as those of conventional reflowable SOGs. The low-shrinkage SOG has thermal stability up to 800 ℃ and chemical stability against diluted hydrofluoric acid, sulfuric acid-hydrogen peroxide, and amine-based solutions, which makes it possible to be used as an interlevel dielectric of memory devices. Tungsten and aluminum interconnects fabricated using the low-shrinkage SOG showed a parasitic capacitance 30% lower than those fabricated using silicon dioxide and a sufficiently long line-to-line dielectric breakdown lifetime. Taking advantage of the high chemical stability of the SOG, an all-wet damageless via-formation process using an amine-based photoresist stripper has been developed. By using the process, the low-shrinkage SOG can be applied to multilevel metallization.
机译:已经开发出一种新的k值为2.4的低介电常数旋转玻璃(SOG),用于先进存储设备中的间隙填充工艺。 SOG在热固化过程中的低收缩特性提供了与常规可回流SOG一样高的间隙填充和平坦化功能。低收缩SOG具有高达800℃的热稳定性,并且对稀氢氟酸,硫酸-过氧化氢和胺基溶液具有化学稳定性,这使其有可能用作存储器件的层间电介质。使用低收缩SOG制成的钨和铝互连件的寄生电容比使用二氧化硅制成的寄生电容低30%,并且具有足够长的线间绝缘击穿寿命。利用SOG的高化学稳定性,已开发出使用胺基光刻胶剥离剂的全湿无损通孔形成工艺。通过使用该工艺,可以将低收缩SOG应用于多层金属化。

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  • 来源
    《Japanese journal of applied physics》 |2012年第3issue1期|p.031501.1-031501.6|共6页
  • 作者单位

    Central Research Laboratory, Hitachi, Ltd., Kokubunji, Tokyo 185-8601, Japan;

    Electronic Materials Business Sector, Hitachi Chemical Co., Ltd., Hitachi, Ibaraki 317-8555, Japan;

    Electronic Materials Business Sector, Hitachi Chemical Co., Ltd., Hitachi, Ibaraki 317-8555, Japan;

    Central Research Laboratory, Hitachi, Ltd., Kokubunji, Tokyo 185-8601, Japan;

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