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Structural Changes Caused by Quenching of lnAs/GaAs(001) Quantum Dots

机译:lnAs / GaAs(001)量子点淬火引起的结构变化

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摘要

Self-assembled lnAs/GaAs(001) quantum dot structures before and after quenching were investigated by in situ X-ray diffraction to assess the effects of quenching. Before quenching, quantums dots were uniform in size so that the shape and internal lattice constant distribution of a quantum dot were quantitatively determined on the basis of three-dimensional X-ray intensity mapping. X-ray measurements after quenching revealed that the quantum dot size showed a bimodal distribution as a result of the proliferation of dislocated islands during quenching. A formula to describe the X-ray diffraction from dislocated islands with a large size distribution is presented. The cooling rate between 20 and 40 K/min was found to have little effect on the structures of quenched quantum dots.
机译:通过原位X射线衍射研究淬灭前后自组装的lnAs / GaAs(001)量子点结构,以评估淬灭的效果。在淬灭之前,量子点的大小是均匀的,从而基于三维X射线强度映射来定量确定量子点的形状和内部晶格常数分布。淬火后的X射线测量表明,由于淬火过程中位错岛的扩散,量子点尺寸显示出双峰分布。提出了描述从大尺寸分布的错位岛上进行X射线衍射的公式。发现在20和40K / min之间的冷却速率对淬灭的量子点的结构几乎没有影响。

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  • 来源
    《Japanese journal of applied physics》 |2011年第4issue2期|p.04DH06.1-04DH06.5|共5页
  • 作者单位

    Quantum Beam Science Directorate, Japan Atomic Energy Agency, Sayo, Hyogo 679-5148, Japan;

    Quantum Beam Science Directorate, Japan Atomic Energy Agency, Sayo, Hyogo 679-5148, Japan;

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