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首页> 外文期刊>Japanese journal of applied physics >Source/Drain Engineering for ln_(0.7)Ga_(0.3)As N-Channel Metal-Oxide-Semiconductor Field-Effect Transistors: Raised Source/Drain with In situ Doping for Series Resistance Reduction
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Source/Drain Engineering for ln_(0.7)Ga_(0.3)As N-Channel Metal-Oxide-Semiconductor Field-Effect Transistors: Raised Source/Drain with In situ Doping for Series Resistance Reduction

机译:ln_(0.7)Ga_(0.3)As N沟道金属氧化物半导体场效应晶体管的源极/漏极工程:带原位掺杂的高串联源极/漏极降低串联电阻

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摘要

In this paper, we report N-channel metal-oxide-semiconductor field-effect transistors (N-MOSFETs) featuring in situ doped raised ln_(0.53)Ga_(0.47)As source/drain (S/D) regions. This is the first demonstration of such regrowth on an ln_(0.7)Ga_(0.3)As channel. After SiON spacer formation, the raised ln_(0.53)Ga_(0.47)As S/D structure was formed by selective epitaxy of ln_(0.53)Ga_(0.47)As in the S/D regions by metal-organic chemical-vapor deposition (MOCVD). In situ silane SiH_4 doping was also introduced to boost the N-type doping concentration in the S/D regions for series resistance R_(sd) reduction. The raised S/D structure contributes to /_(Dsat) enhancement for the ln_(0.7)Ga_(0.3)As N-MOSFETs.
机译:在本文中,我们报告了以原位掺杂的凸起ln_(0.53)Ga_(0.47)As源/漏(S / D)区为原位掺杂的N沟道金属氧化物半导体场效应晶体管(N-MOSFET)。这是在ln_(0.7)Ga_(0.3)As通道上进行此类再生的第一个演示。在形成SiON隔离层之后,通过金属有机化学气相沉积法在S / D区域中通过选择性外延ln_(0.53)Ga_(0.47)As形成凸起的ln_(0.53)Ga_(0.47)As S / D结构( MOCVD)。还引入了原位硅烷SiH_4掺杂以提高S / D区域中的N型掺杂浓度,以降低串联电阻R_(sd)。凸起的S / D结构有助于ln_(0.7)Ga_(0.3)As N-MOSFET的/ _(Dsat)增强。

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  • 来源
    《Japanese journal of applied physics》 |2011年第4issue2期|p.04DF01.1-04DF01.4|共4页
  • 作者单位

    Department of Electrical and Computer Engineering, National University of Singapore, Singapore 117576,NUS Graduate School of Integrative Sciences and Engineering, National University of Singapore, Singapore 117456;

    Department of Electrical and Computer Engineering, National University of Singapore, Singapore 117576;

    Department of Electrical and Computer Engineering, National University of Singapore, Singapore 117576;

    Department of Electrical and Computer Engineering, National University of Singapore, Singapore 117576,NUS Graduate School of Integrative Sciences and Engineering, National University of Singapore, Singapore 117456;

    Department of Electrical and Computer Engineering, National University of Singapore, Singapore 117576,NUS Graduate School of Integrative Sciences and Engineering, National University of Singapore, Singapore 117456;

    Department of Electrical and Computer Engineering, National University of Singapore, Singapore 117576;

    Institute of Materials Research and Engineering, Agency for Science Technology and Research, Singapore 117602;

    Institute of Materials Research and Engineering, Agency for Science Technology and Research, Singapore 117602;

    Department of Electrical and Computer Engineering, National University of Singapore, Singapore 117576,NUS Graduate School of Integrative Sciences and Engineering, National University of Singapore, Singapore 117456;

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