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首页> 外文期刊>Japanese Journal of Applied Physics. Part 2, Letters & Express Letters >Properties of Nanocrystalline Cubic Silicon Carbide Thin Films Prepared by Hot-Wire Chemical Vapor Deposition Using SiH_4/CH_4/H_2 at Various Substrate Temperatures
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Properties of Nanocrystalline Cubic Silicon Carbide Thin Films Prepared by Hot-Wire Chemical Vapor Deposition Using SiH_4/CH_4/H_2 at Various Substrate Temperatures

机译:SiH_4 / CH_4 / H_2在不同衬底温度下通过热线化学气相沉积制备的纳米晶立方碳化硅薄膜的性能

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摘要

Silicon carbide (SiC) thin films were prepared by hot-wire chemical vapor deposition from SiH_4/CH_4/H_2 gases, and the influence of substrate temperature, T_s (104 < T_s < 434 °C), on the properties of the SiC thin films was investigated. X-ray diffraction patterns and Raman scattering spectra revealed that nanocrystalline cubic SiC (nc-3C-SiC) films grew at T_s above 187°C, while completely amorphous films grew at T_s = 104°C. Fourier transform infrared absorption spectra revealed that the crystallinity of the nc-3C-SiC was improved with increasing T_s up to 282 °C and remained almost unchanged with a further increase in T_s from 282 to 434 °C. The spin density was reduced monotonically with increasing T_s.
机译:通过热线化学气相沉积从SiH_4 / CH_4 / H_2气体制备碳化硅(SiC)薄膜,以及衬底温度T_s(104

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