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首页> 外文期刊>Japanese Journal of Applied Physics. Part 1, Regular Papers, Brief Communications & Review Papers >Electric Conduction of Thin-Layer Ni-Multilayer Ceramic Capacitors with Core-Shell Structure BaTiO_3
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Electric Conduction of Thin-Layer Ni-Multilayer Ceramic Capacitors with Core-Shell Structure BaTiO_3

机译:BaTiO_3核壳结构的薄层镍多层陶瓷电容器的导电

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摘要

The electric conduction mechanism for multilayer ceramic capacitors with Ni internal electrodes (Ni-MLCCs) was investigated, utilizing impedance spectroscopy (IS) and thermally stimulated current (TSC) measurement techniques. A modified 4RC equivalent circuit model was proposed to analyze the IS data for the Ni-MLCCs. This model revealed that electrode/ceramics interfaces (E/C-I) and grain boundaries (GBs) have a Schottky type conduction mechanism controlling the leakage behavior at low electric field. The Schottky barrier height at E/C-I and surface level height at GB were calculated being 1.43 and 1.06 eV, respectively. The Ni-MLCCs showed a tunneling conduction occurs with high dc electric fields of more than 10 V/μm. The onset electric field for the tunneling conduction shifted toward high electric fields as the Mn content of the capacitors increased. TSC measurements revealed that a low Mn content resulted in high mobile oxygen vacancies concentration in the Ni-MLCCs. Mn also played a role in preventing oxygen vacancies from migrating to cathode electrodes, which resulted in a long lifetime for the Ni-MLCCs.
机译:利用阻抗谱(IS)和热激电流(TSC)测量技术,研究了带有Ni内部电极(Ni-MLCC)的多层陶瓷电容器的导电机理。提出了一种改进的4RC等效电路模型来分析Ni-MLCC的IS数据。该模型表明,电极/陶瓷界面(E / C-I)和晶界(GBs)具有肖特基型导电机制,可控制低电场下的泄漏行为。计算出E / C-1处的肖特基势垒高度和GB处的表面能级高度分别为1.43和1.06eV。 Ni-MLCCs显示在超过10 V /μm的高直流电场中发生了隧道传导。随着电容器中Mn含量的增加,隧穿传导的起始电场向高电场转移。 TSC测量结果表明,低含量的Mn导致Ni-MLCC中较高的移动氧空位浓度。锰还起到防止氧空位迁移到阴极电极的作用,从而延长了Ni-MLCC的寿命。

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