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首页> 外文期刊>Japanese Journal of Applied Physics. Part 1, Regular Papers, Brief Communications & Review Papers >Quantitative Analysis of Polarization Phenomena in CdTe Radiation Detectors
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Quantitative Analysis of Polarization Phenomena in CdTe Radiation Detectors

机译：CdTe辐射探测器中偏振现象的定量分析

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摘要

Polarization phenomena in a Schottky-type CdTe radiation detector were studied. We evaluated the distribution of electric field in a biased CdTe detector by measuring the progressive change of Schottky barrier lowering with time. The parameters of deep acceptors such as detrapping time, concentration, and the depth of the energy level were quantitatively evaluated. In the case of applying the conventional model of charge accumulation, the obtained result shows that the CdTe bulk is never undepleted. We modified the charge accumulation model by taking account of the occupation state of the deep acceptor level. When a modified model is applied, the time that the depletion width in the bulk begins to diminish closely fits the time that the photopeak position begins to shift in radiation measurements. In this paper, we present a distribution of electric field during biasing and a simple method for the evaluation of the parameters of deep acceptors in CdTe bulk.
机译：研究了肖特基型CdTe辐射探测器的偏振现象。我们通过测量肖特基势垒随时间降低的渐进变化来评估偏置CdTe检测器中的电场分布。定量评估了深受体的参数，例如脱阱时间，浓度和能级深度。在使用常规电荷累积模型的情况下，所获得的结果表明CdTe块体永远不会耗尽。我们通过考虑深受体水平的占据状态来修改电荷积累模型。当应用修改的模型时，主体中的耗尽宽度开始减小的时间与辐射测量中光电峰值位置开始移动的时间非常吻合。在本文中，我们介绍了偏置过程中的电场分布以及一种用于评估CdTe体中深受体参数的简单方法。

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