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首页> 外文期刊>Japanese Journal of Applied Physics. Part 1, Regular Papers, Brief Communications & Review Papers >Characteristics of Fatigue Induced by Distribution of Defect Charges in SrBi_2Ta_2O_9 Capacitors
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Characteristics of Fatigue Induced by Distribution of Defect Charges in SrBi_2Ta_2O_9 Capacitors

机译：SrBi_2Ta_2O_9电容器中缺陷电荷的分布引起的疲劳特性

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Pt/SrBi_2Ta_2O_9 (SBT)/Pt capacitors have been successfully fabricated using a metalorganic decomposition (MOD) technique. The switchable polarization of SBT capacitors showed a tendency to increase with the number of switching cycles at first and then decrease after 2 x 10~9 switching cycles. During the switching process, a competition existed between the depinning behavior of domains and the aggregation of defect charges at the interfaces between SBT thin films and electrodes. It was this competition that determined the fatigue characterization for SBT capacitors. Higher external voltages facilitated the recovery of polarization suppression, which suggests that more domains in the SBT thin films were easily depinned by a higher external field and the pinning depth due to defect charges was different.
机译：Pt / SrBi_2Ta_2O_9（SBT）/ Pt电容器已使用金属有机分解（MOD）技术成功制造。 SBT电容器的可切换极化起初随切换周期数增加而增加，然后在2 x 10〜9个切换周期后减少。在切换过程中，在SBT薄膜和电极之间的界面处，畴的钉扎行为与缺陷电荷的聚集之间存在竞争。正是这场竞争决定了SBT电容器的疲劳特性。较高的外部电压促进了极化抑制的恢复，这表明SBT薄膜中的更多区域很容易被较高的外部电场固定，并且由于缺陷电荷导致的固定深度不同。

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