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首页> 外文期刊>Japanese Journal of Applied Physics. Part 1, Regular Papers, Brief Communications & Review Papers >Short Term Frequency Stability Tests of Two Cryogenic Sapphire Oscillators
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Short Term Frequency Stability Tests of Two Cryogenic Sapphire Oscillators

机译：两个低温蓝宝石振荡器的短期频率稳定性测试

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摘要

Ultra-high short-term frequency stability has been realized in microwave oscillators based on liquid helium cooled sapphire resonators which operate on the same Whispering Gallery mode. Two cryogenic sapphire oscillators were built to evaluate their stability at short averaging times. These oscillators exhibited a fractional frequency stability of 1.1 x 10~(-15) at an averaging time of 1 s, which is more than 100 times better than that of a hydrogen maser. For averaging times between 2 and 640 s the measured oscillator fractional frequency instability was below 10~(-15) with a minimum of 5.5 x 10~(-16) at an averaging time of 20 s. The noise floors of the control servos which contribute to the short-term frequency stability are also discussed.
机译：在基于液氦冷却的蓝宝石谐振器的微波振荡器中实现了超高的短期频率稳定性，该微波振荡器以相同的“回音壁”模式工作。构建了两个低温蓝宝石振荡器，以评估其在短平均时间内的稳定性。这些振荡器在平均1 s的时间内表现出1.1 x 10〜（-15）的分数频率稳定性，比氢激子的频率稳定性高100倍以上。对于2到640 s之间的平均时间，测得的振荡器分数频率不稳定性低于10〜（-15），平均时间为20s时最小值为5.5 x 10〜（-16）。还讨论了有助于短期频率稳定性的控制伺服器的本底噪声。

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