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首页> 外文期刊>Japanese Journal of Applied Physics. Part 2, Letters & Express Letters >Step-Flow Growth of In-Polar InN by Molecular Beam Epitaxy
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Step-Flow Growth of In-Polar InN by Molecular Beam Epitaxy

机译:分子束外延法逐步生长In-InN

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摘要

The step-flow mode growth of an In-polar InN epilayer on a GaN template was achieved by molecular beam epitaxy. A uniform terrace structure was observed with a step height of one monolayer. The surface rms roughness was less than 1 nm over a 10 x 10 μm~2 area. To obtain the step-flow mode growth, it was preferable to use a slightly In-rich growth condition in the In-polarity growth regime, a GaN template of low dislocation density, and a high epitaxial temperature. A typical electron concentration of bulk InN was 5-6 x 10~(17) cm~(-3) with a Hall mobility of 1400cm~2/(Vs).
机译:GaN模板上的In-InN外延层的阶梯流模式生长是通过分子束外延实现的。观察到具有一个单层台阶高度的均匀平台结构。在10 x 10μm〜2的面积上,表面均方根粗糙度小于1 nm。为了获得阶梯流模式生长,优选在In-极性生长方案中使用稍微富In的生长条件,低位错密度的GaN模板和高外延温度。 InN的典型电子浓度为5-6 x 10〜(17)cm〜(-3),霍尔迁移率为1400cm〜2 /(Vs)。

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