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首页> 外文期刊>Japanese Journal of Applied Physics. Part 1, Regular Papers, Brief Communications & Review Papers >Measurement of the True Value of the Carrier-Envelope Phase of a Few-Cycle Laser Pulse by the Interference between Second and Third Harmonics from the Surface of a Solid
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Measurement of the True Value of the Carrier-Envelope Phase of a Few-Cycle Laser Pulse by the Interference between Second and Third Harmonics from the Surface of a Solid

机译:通过固体表面的第二和第三谐波之间的干扰来测量少量循环激光脉冲的载波包络相位的真值

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摘要

We demonstrate a measurement that provides the true value of the carrier-envelope phase using a few-cycle laser pulse. The measurement is based on the interference between the second and third harmonics from the surface of a solid. The interference intensity is sensitive to the carrier-envelope phase. This result for low-energy pulses will lead to a new technique for measuring the carrier-envelope phase.
机译:我们演示了使用几个周期的激光脉冲提供载波-包络相位的真实值的测量方法。该测量基于来自固体表面的二次谐波和三次谐波之间的干扰。干扰强度对载波包络相位敏感。低能量脉冲的这一结果将导致一种用于测量载波-包络相位的新技术。

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