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首页> 外文期刊>Japanese Journal of Applied Physics. Part 2, Letters & Express Letters >Optimized Coalescence Method for the Metalorganic Chemical Vapor Deposition (MOCVD) Growth of High Quality Al-Polarity AlN Films on Sapphire
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Optimized Coalescence Method for the Metalorganic Chemical Vapor Deposition (MOCVD) Growth of High Quality Al-Polarity AlN Films on Sapphire

机译:优化的聚结方法用于在蓝宝石上生长高质量Al-Polarity AlN薄膜的金属有机化学气相沉积(MOCVD)

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摘要

Epitaxial Al-polarity AlN films were deposited on (0001) sapphire using a metalorganic chemical vapor deposition process involving a modulated ammonia/trimethyl aluminum flow, a pressure reduction from 150Torr to 40Torr after the first stage of growth, and growing the first ~0.1 μm of AlN at a moderate Ⅴ/Ⅲ ratio, followed by a switch to low Ⅴ/Ⅲ for the remainder of the growth. Smooth, flat epitaxial films with a full width half maximum of the X-ray rocking curves as low as 177 arcseconds/650 arcseconds for the (0002)/(1012) reflections were obtained.
机译:外延Al-极性AlN膜使用金属有机化学气相沉积工艺沉积在(0001)蓝宝石上,该工艺涉及调制的氨/三甲基铝流量,生长的第一阶段后压力从150Torr降低至40Torr,并开始生长约0.1μm在中等的Ⅴ/Ⅲ比例下生长AlN,然后在其余的生长过程中切换到较低的Ⅴ/Ⅲ。获得了光滑的,平坦的外延膜,其对于(0002)/(1012)反射,X射线摇摆曲线的全宽度半最大值低至177弧秒/ 650弧秒。

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