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首页> 外文期刊>Japanese Journal of Applied Physics. Part 2, Letters >High-Critical-Current-Density SmBa_2Cu_3O_(7-x) Films Induced by Surface Nanoparticle
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High-Critical-Current-Density SmBa_2Cu_3O_(7-x) Films Induced by Surface Nanoparticle

机译：表面纳米粒子诱导的高临界电流密度SmBa_2Cu_3O_（7-x）薄膜

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摘要

In oxide-based superconducting thin films, conceivable factors that give rise to a pinning center include dislocations, precipitates, twin boundaries, and a-axis-oriented phases. In this study, crystalline defects were created perpendicular to a high-J_c Sm_(1-x)Ba__(2-x)Cu_3O_y, film surface during a film deposition process. We obtained extremely high J_c values, J_c = 0.37 MA/cm~2 (77 K, B // c, B = 5 T) and J_c = 0.1 MA/cm~2 (77 K, B // c, B = 8 T). These values are equal to or exceed that of the previously reported NbTi wire material measured in a high magnetic field at 4.2K.
机译：在氧化物基超导薄膜中，引起钉扎中心的可能因素包括位错，沉淀，孪晶边界和a轴取向相。在这项研究中，在膜沉积过程中垂直于高J_c Sm_（1-x）Ba __（2-x）Cu_3O_y膜表面产生了晶体缺陷。我们获得了极高的J_c值，J_c = 0.37 MA / cm〜2（77 K，B // c，B = 5 T）和J_c = 0.1 MA / cm〜2（77 K，B // c，B = 8 T）。这些值等于或超过以前报道的NbTi线材在4.2K的高磁场中测得的值。

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