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首页> 外文期刊>Japanese Journal of Applied Physics. Part 2, Letters & Express Letters >Ga Adlayer Governed Surface Defect Evolution of (0001)GaN Films Grown by Plasma-Assisted Molecular Beam Epitaxy
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Ga Adlayer Governed Surface Defect Evolution of (0001)GaN Films Grown by Plasma-Assisted Molecular Beam Epitaxy

机译:等离子体辅助分子束外延生长Ga层控制的(0001)GaN薄膜的表面缺陷演变

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摘要

The impact of the Ga adlayer coverage onto the surface morphologies and pit densities of GaN (0001) films grown by plasma-assisted molecular beam epitaxy (PAMBE) has been studied using quantitative in situ quadrupole mass spectrometry (QMS). As the equilibrium Ga adlayer coverages rise continuously from 0 to 2.5 monolayers (ML) the surface pit densities decrease from ~2 x 10~9 cm~(-2) to zero, yielding characteristic step-flow and spiral growth hillock features. These results show that there is a direct and quantitative link between Ga adlayer coverage, adatom diffusion and surface defect structure without any discontinuities.
机译:使用定量原位四极杆质谱(QMS)研究了Ga覆盖层覆盖对通过等离子体辅助分子束外延(PAMBE)生长的GaN(0001)薄膜的表面形态和凹坑密度的影响。随着平衡Ga覆盖层的覆盖范围从0到2.5单层(ML)不断增加,表面凹坑密度从〜2 x 10〜9 cm〜(-2)减小到零,从而产生特征性的阶跃流和螺旋形生长丘陵特征。这些结果表明,Ga的附加层覆盖,原子扩散与表面缺陷结构之间存在直接而定量的联系,而没有任何不连续性。

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