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首页> 外文期刊>Japanese Journal of Applied Physics. Part 2, Letters >Structure of the Sb/Si(112) Surface Studied by Low Energy Electron Diffraction
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Structure of the Sb/Si(112) Surface Studied by Low Energy Electron Diffraction

机译:低能电子衍射研究Sb / Si(112)表面的结构

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摘要

We have investigated the Sb-induced phase transition of the reconstructed Si(112) surface by low energy electron diffraction (LEED) and X-ray photoelectron spectroscopy (XPS). A sharp sixfold hexagonal LEED pattern was observed when Sb was deposited on the clean Si(112) surface at 300℃, corresponding to the bulk-terminated 1 x 1 structure of the Si(111) surface. From the LEED pattern and the XPS results, we suggest a surface structure corresponding to the LEED pattern with (111) -1 x 1 + weak 5 x 1 spots for the Sb/Si(112) surface.
机译:我们已经通过低能电子衍射(LEED)和X射线光电子能谱(XPS)研究了Sb诱导的重构Si(112)表面的相变。当Sb在300℃下沉积在干净的Si(112)表面上时,观察到了清晰的六重六边形LEED图案,这对应于Si(111)表面的本体封端的1 x 1结构。从LEED图案和XPS结果,我们建议一种与LEED图案相对应的表面结构,其中Sb / Si(112)表面具有(111)-1 x 1 + 5 x 1弱点。

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