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首页> 外文期刊>Japanese journal of applied physics >Transmission electron microscopy observation of crystal twinning in periodically inverted AlGaAs grown by low-temperature molecular beam epitaxy
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Transmission electron microscopy observation of crystal twinning in periodically inverted AlGaAs grown by low-temperature molecular beam epitaxy

机译:低温分子束外延生长周期性倒置AlGaAs中晶体孪晶的透射电镜观察

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摘要

We report on the twin structures formed in periodically inverted AlGaAs fabricated by a sublattice-reversal epitaxy technique identified by conventional transmission electron microscopy (TEM). By two-beam-condition TEM and X-ray diffraction analysis, we have confirmed that the twin structures are formed on the (111)A and (1 (1) over bar (1) over bar )A planes in both inverted and noninverted domains. (C) 2018 The Japan Society of Applied Physics
机译:我们报告了通过常规透射电子显微镜(TEM)识别的亚晶格反转外延技术制造的周期性倒置的AlGaAs中形成的孪生结构。通过两束条件TEM和X射线衍射分析,我们已经确认在(111)A和(1)在(1)上方的棒(A)平面上的孪晶结构在反向和非反向中均形成在域。 (C)2018日本应用物理学会

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