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首页> 外文期刊>Japanese journal of applied physics >Core depth determination of a slightly buried Si-wire waveguide with a reduced bend loss
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Core depth determination of a slightly buried Si-wire waveguide with a reduced bend loss

机译：芯深度测定略微埋入的Si-Wire波导，弯曲损耗降低

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摘要

The effects of adjusting the distance between a core and an air-cladding interface on the propagation properties are investigated in a bent Si-wire waveguide. The eigenmode analysis is carried out using the imaginary-distance beam-propagation method based on Yee's mesh in the cylindrical co-ordinate system. The pure bend loss (PBL) is evaluated as a function of core depth for several core aspect ratios. Since a waveguide bend causes polarization coupling, the polarization crosstalk (PCT) is also evaluated by the propagation analysis with the aid of the FDTD method. It is found that a core depth with a minimized PBL exists for the TM mode when the air-cladding interface is placed at the position where the field amplitude decays to approximately 5% of its peak, with a PCT being less than -30 dB.
机译：在弯曲的Si-Wire波导中研究了调节芯与空气包层界面之间的距离的效果。 使用基于YEE网格在圆柱坐标系统中的易距离光束传播方法进行了特征模分析。 纯弯曲损耗（PBL）被评估为几个核心纵横比的核心深度的函数。 由于波导弯曲导致偏振耦合，因此还通过借助于FDTD方法来评估偏振串扰（PCT）。 发现当空气包层接口放置在场幅度衰减到其峰的大约5％的位置时，对于TM模式，存在具有最小化PBL的核心深度，PCT小于-30dB。

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