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首页> 外文期刊>Journal of Applied Physics >Component analysis of a mixed beam generated by vacuum electrospray of an ionic liquid
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Component analysis of a mixed beam generated by vacuum electrospray of an ionic liquid

机译：真空电喷雾离子液体产生的混合束的成分分析

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摘要

Vacuum electrospray of a quaternary ammonium ionic liquid, N,N-diethyl-N-methyl-N-{2-methoxyethyl)ammonium bis(trifluoromethanesulfonyl) amide (DEME-TFSA), was investigated to develop a primary ion source for secondary ion mass spectrometry (SIMS). Since the ionic liquid contains many methyl and ethyl groups as well as protons, its beam is expected to efficiently produce protonated molecules for SIMS analysis of organic materials. Experimental results showed that the beam consisted of charged particles of mlz about 1000 and charged droplets of m/z > 10~5. The current components of both the charged particles and droplets changed with the applied voltage and the flow rate of the ionic liquid. With decreasing flow rate, the current component of the charged droplets increased, whereas that of the charged particles decreased. The m/z values of the charged droplets diminished with decreasing flow rate and increasing capillary voltage. In addition to masses and charge numbers, the numbers of the charged droplets and the charged particles were estimated.
机译：研究了季铵离子液体N，N-二乙基-N-甲基-N- {2-甲氧基乙基）双（三氟甲磺酰基）酰胺铵（DEME-TFSA）的真空电喷雾以开发用于次级离子质量的主离子源光谱仪（SIMS）。由于离子液体包含许多甲基和乙基以及质子，因此其离子束有望有效产生用于有机材料SIMS分析的质子化分子。实验结果表明，该光束由约1000个mlz带电粒子和m / z> 10〜5的带电液滴组成。带电粒子和液滴的电流分量都随施加的电压和离子液体的流速而变化。随着流速的降低，带电液滴的电流成分增加，而带电粒子的电流成分减少。带电液滴的m / z值随着流速的降低和毛细管电压的升高而减小。除了质量和电荷数，还估计了带电液滴和带电粒子的数量。

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  • 来源
    《Journal of Applied Physics》 |2012年第6期|p.064901.1-064901.7|共7页
  • 作者

    Yukio Fujiwara; Naoaki Saito; Hidehiko Nonaka; Shingo Ichimura;

  • 作者单位

    National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba Central 2,1-1-1 Umezono,Tsukuba-shi, Ibaraki-ken 305-8568, Japan;

    National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba Central 2,1-1-1 Umezono,Tsukuba-shi, Ibaraki-ken 305-8568, Japan;

    National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba Central 2,1-1-1 Umezono,Tsukuba-shi, Ibaraki-ken 305-8568, Japan;

    National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba Central 2,1-1-1 Umezono,Tsukuba-shi, Ibaraki-ken 305-8568, Japan;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
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  • 正文语种 eng
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