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首页> 外文期刊>Journal of Applied Physics >Examination of Au, Cu, and Al contacts in organic field-effect transistors via displacement current measurements
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Examination of Au, Cu, and Al contacts in organic field-effect transistors via displacement current measurements

机译：通过位移电流测量检查有机场效应晶体管中的Au，Cu和Al触点

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摘要

Displacement current measurements (DCM) on long-channel capacitors (LCCs) were used to examine carrier injection and extraction processes in organic field-effect transistors (OFETs). An LCC can be seen as an OFET with one channel contact removed and the conducting channel elongated to millimeter range. While carrier injection and extraction processes occur simultaneously in OFETs during traditional DC measurements, these two processes can be examined separately with LCCs and DCMs. In addition, the numbers of injected, extracted, and trapped carriers can be determined by integrating the displacement current with respect to time. Pentacene LCCs with Au, Cu, and Al contacts were fabricated. Surprisingly, it was found that more carriers were trapped in the Au devices than in the Cu devices even though the pentacene film and dielectric layers were essentially identical. We propose that carrier trapping in the long channel of the Au devices is indirectly caused by the deep trap states at the pentacene-dielectric interface in the contact region generated by Au penetration. In addition, ambipolar injection and transport were observed in an LCC with an Al contact and a PMMA buffer layer between pentacene and SiO_2.
机译：长沟道电容器（LCC）上的位移电流测量（DCM）用于检查有机场效应晶体管（OFET）中的载流子注入和提取过程。 LCC可以看作是一个OFET，其中一个通道触点已移除，导电通道拉长到毫米范围。在传统的DC测量过程中，虽然在OFET中会同时发生载流子注入和提取过程，但可以使用LCC和DCM分别检查这两个过程。另外，可以通过对位移电流相对于时间进行积分来确定注入，提取和捕获的载流子的数量。制作了具有Au，Cu和Al触点的并五苯LCC。令人惊讶地，发现尽管并五苯膜和介电层基本相同，但是在Au器件中俘获的载流子比在Cu器件中俘获的载流子更多。我们提出载流子在Au器件的长沟道中的俘获是由并五苯-介电界面在Au穿透产生的接触区域中的深俘获态间接引起的。另外，在并五苯和SiO_2之间具有Al接触和PMMA缓冲层的LCC中观察到双极性注入和传输。

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  • 来源
    《Journal of Applied Physics》 |2011年第6期|p.064514.1-064514.7|共7页
  • 作者

    Yan Liang; Hsiu-Chuang Chang; P. Paul Ruden; C. Daniel Frisbie;

  • 作者单位

    Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis,Minnesota 55455, USA;

    Department of Electrical and Computer Engineering, University of Minnesota, Minneapolis,Minnesota 55455, USA;

    Department of Electrical and Computer Engineering, University of Minnesota, Minneapolis,Minnesota 55455, USA;

    Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis,Minnesota 55455, USA;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
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  • 正文语种 eng
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