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首页> 外文期刊>Journal of Applied Physics >Direct correlation between ferrite microstructure and electrical resistivity
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Direct correlation between ferrite microstructure and electrical resistivity

机译：铁素体微结构与电阻率之间的直接关系

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摘要

Variations in the composition and microstructure of Mn-Zn soft ferrites have been directly correlated with spatial variations in electrical resistivity, which were both observed to occur on a length scale of approximately 500 μm. Tomographic energy dispersive diffraction imaging (TEDDI) was used to determine the nonsystematic change in the lattice parameter across the sample volume (8.48 ± 0.05 A) at a spatial resolution of 50 μm. We have used a microprobe contact technique to measure the local electrical resistivity (～35 Ω cm) and density functional theory to model the band structure. The band structure calculations directly utilized the experimentally measured lattice parameters from the TEDDI measurements and were in good agreement with the measured resistivity. The mean band gap shrinkage was found to be 0.02 eV. This value for E_g was found to account well for the observed 10-20 Ω cm resistivity variations.
机译：Mn-Zn软质铁氧体的组成和微观结构的变化与电阻率的空间变化直接相关，这两个变化均发生在大约500μm的长度范围内。层析能量色散衍射成像（TEDDI）用于确定空间分辨率为50μm时样品体积（8.48±0.05 A）上晶格参数的非系统性变化。我们使用微探针接触技术来测量局部电阻率（〜35Ωcm），并使用密度泛函理论对能带结构进行建模。带结构计算直接利用了TEDDI测量中实验测得的晶格参数，与测得的电阻率非常吻合。发现平均带隙收缩为0.02eV。发现该E_g值很好地解释了所观察到的10-20Ωcm的电阻率变化。

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