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首页> 外文期刊>Journal of Crystal Growth >Reduction of threading dislocations in migration enhanced epitaxy grown GaN with N-polarity by use of AIN multiple interlayer
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Reduction of threading dislocations in migration enhanced epitaxy grown GaN with N-polarity by use of AIN multiple interlayer

机译:通过使用AIN多层中间层减少迁移增强的外延生长的N极性GaN中的螺纹位错

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摘要

High quality GaN layer was obtained by insertion of high temperature grown AIN multiple intermediate layers with migration enhanced epitaxy method by the RF-plasma assisted molecular beam epitaxy on (0001) sapphire substrates. The propagating behaviors of dislocations were studied, using a transmission electron microscope.
机译:通过用RF等离子体辅助分子束外延在(0001)蓝宝石衬底上插入具有迁移增强外延方法的高温生长的AIN多个中间层,从而获得高质量的GaN层。使用透射电子显微镜研究了位错的传播行为。

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