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首页> 外文期刊>Journal of Crystal Growth >Defects in flux and Czochralski grown β-BaB_2O_4 crystals observed by light scattering tomography
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Defects in flux and Czochralski grown β-BaB_2O_4 crystals observed by light scattering tomography

机译:光散射层析成像观察到通量和直拉生长的β-BaB_2O_4晶体的缺陷

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摘要

It is a very interesting fact that the β-BaB_2O_4 (BBO) crystals are grown both by the flux method and the Czochralski (CZ) method from a stoichiometric melt. Defects in the BBO crystals grown by these two methods were examined in detail by light scattering tomography (LST). Many narrow and extremely thin platelets were optically observed on the rhombohedral (R) planes of the CZ and also of the flux-grown BBO crystals. This phenomenon of very similar defects being observed in both crystals is unique, because defects in crystals usually depend on how they were grown.
机译:一个非常有趣的事实是,β-BaB_2O_4(BBO)晶体是通过化学计量熔体通过通量法和切克劳斯基(CZ)方法生长的。通过光散射层析成像(LST)详细检查了通过这两种方法生长的BBO晶体中的缺陷。在CZ的菱形(R)平面以及助熔剂生长的BBO晶体的光学上观察到许多狭窄且极薄的血小板。在两种晶体中都观察到非常相似的缺陷的现象是独特的,因为晶体中的缺陷通常取决于它们的生长方式。

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