首页> 外文期刊>Journal of Crystal Growth >Czochralski growth and characterization of piezoelectric single crystals with langasite structure: La_3Ga_5SiO_(14) (LGS), La_3Ga_(5.5)Nb_(0.5)O_(14) (LGN) and La_3Ga_(5.5)Ta_(0.5)O_(14) (LGT) Ⅱ. Piezoelectric and elastic properties
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Czochralski growth and characterization of piezoelectric single crystals with langasite structure: La_3Ga_5SiO_(14) (LGS), La_3Ga_(5.5)Nb_(0.5)O_(14) (LGN) and La_3Ga_(5.5)Ta_(0.5)O_(14) (LGT) Ⅱ. Piezoelectric and elastic properties

机译:镧铁矿型压电单晶的直拉晶体生长和表征:La_3Ga_5SiO_(14)(LGS),La_3Ga_(5.5)Nb_(0.5)O_(14)(LGN)和La_3Ga_(5.5)Ta_(0.5)O_(14)(LGT) )Ⅱ。压电和弹性

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摘要

Mass densities, relative dielectric constants, and piezoelectric material parameters were determined on single crystals of LGS, LGN, and LGT grown with high structural perfection by the Czochralski technique. Optimized values of the elastic stiffnesses and elastic compliances were derived by measuring and critically comparing the propagation velocities of both bulk (BAW) and surface acoustic waves (SAW).
机译:质量密度,相对介电常数和压电材料参数是通过Czochralski技术在高结构完美度的LGS,LGN和LGT单晶上确定的。通过测量和严格比较体声波(SAW)和声表面波(SAW)的传播速度,可以得出弹性刚度和弹性柔度的最佳值。

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