...
机译:GaN和AlGaN薄膜中位错弯曲和张应力的产生
Materials Research Centre, Indian Institute of Science, Bangalore 560012, India;
Materials Research Institute and Department of Materials Science and Engineering, The Pennsylvania State University, University Park. PA 16802, USA;
Materials Research Institute and Department of Materials Science and Engineering, The Pennsylvania State University, University Park. PA 16802, USA;
Materials Research Institute and Department of Materials Science and Engineering, The Pennsylvania State University, University Park. PA 16802, USA;
A1. Dislocation bending; A1. Kinetics; A1. Stresses; B1. AlGaN; B1. GaN;
机译:AlGaN / GaN薄膜的面受控生长中失配位错的产生
机译:生长过程中表面粗糙度对低迁移率AlGaN薄膜中位错弯曲和应力演变的作用
机译:通过使用渐变的AlGaN缓冲层和SiN_x中间层,可显着降低SiC衬底上生长的GaN膜的面内拉伸应力
机译:AlGaN / GaN薄膜中失配位错的产生
机译:射频磁控溅射生长的GaN薄膜的特性用于制造AlGaN / GaN HEMT生物传感器
机译:使用AlGaN / GaN / AlGaN量子阱电子阻挡层的AlGaN / GaN HEMT中的高击穿电压
机译:评论“SI掺杂对GaN薄膜脱位运动和拉伸应力的影响”J。苹果。物理。 109,073509(2011)