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首页> 外文期刊>Journal of Crystal Growth >Growth of DL-malic acid-doped ammonium dihydrogen phosphate crystal and its characterization
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Growth of DL-malic acid-doped ammonium dihydrogen phosphate crystal and its characterization

机译：DL-苹果酸掺杂磷酸二氢铵晶体的生长及其表征

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Single crystals of DL-malic acid-doped ammonium dihydrogen phosphate have been grown using slow evaporation method and also by Sankaranarayanan-Ramasamy (SR) method with the vision to improve the properties of the ADP crystals. The characterization of grown crystals was made by single-crystal X-ray diffraction, powder X-ray diffraction, UV-vis. spectroscopy, Fourier transform infrared spectro-scopy (FTIR), differential thermal analysis (DTA), Vicker's microhardness, dielectric measurements, high-resolution X-ray diffraction (HRXRD) and second-harmonic studies. Structural difference between pure and doped crystal has been studied by XRD analysis. Functional groups were identified by FTIR spectroscopy. The grown crystals were found to be transparent in the entire visible region. Decomposition temperatures of the grown crystals were measured by DTA. Vicker's hardness study carried out on (001) face at room temperature shows increased hardness of the doped crystals and SR-method-grown crystals. Dielectric measurements reveal that SR-method-grown DLM-doped ADP crystals have low dielectric loss. Crystalline perfection of the grown crystals is analyzed using HRXRD. Preliminary measurements indicate that the second harmonic generation efficiency of the doped crystals at a fundamental wavelength of 1064 nm is roughly 1.5 times greater than that of pure ADP.
机译：DL-苹果酸掺杂的磷酸二氢铵铵的单晶已经使用缓慢蒸发法以及还通过Sankaranarayanan-Ramasamy（SR）方法生长，旨在改善ADP晶体的性能。通过单晶X射线衍射，粉末X射线衍射，UV-vis对生长的晶体进行表征。光谱学，傅立叶变换红外光谱（FTIR），差热分析（​​DTA），维氏显微硬度，介电测量，高分辨率X射线衍射（HRXRD）和二次谐波研究。通过XRD分析研究了纯晶体和掺杂晶体之间的结构差异。通过FTIR光谱法鉴定官能团。发现生长的晶体在整个可见光区域是透明的。通过DTA测量生长的晶体的分解温度。在室温下对（001）面进行的维氏硬度研究表明，掺杂晶体和SR方法生长的晶体的硬度增加。介电测量表明，SR方法生长的DLM掺杂ADP晶体具有低介电损耗。使用HRXRD分析生长晶体的晶体完善度。初步测量表明，在基本波长1064 nm处，掺杂晶体的二次谐波生成效率大约是纯ADP的1.5倍。

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