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首页> 外文期刊>Journal of Crystal Growth >In situ X-ray diffraction during MOCVD of III-nitrides: An optimized wobbling compensating evaluation algorithm
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In situ X-ray diffraction during MOCVD of III-nitrides: An optimized wobbling compensating evaluation algorithm

机译:III型氮化物MOCVD过程中的原位X射线衍射:一种优化的摆动补偿评估算法

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摘要

Presently, we are able to measure in situ X-ray diffraction and spectroscopic ellipsometry simultaneously on rotating samples during the deposition process in our AIXTRON 200 RF-S reactor using a commercial available PANalytical Cu ceramic tube as X-ray source. Due to the natural wobbling of the rotating sample, a compensation algorithm is used before adding up single spectra in order to improve signal-to-noise ratio before fitting procedure. The so far used algorithm is based on the detection of peak maxima representing the center of the peak. In this paper we present an improved compensation algorithm based on a symmetric peak shape enabling the calculation of the peak symmetry axes from the center of weight. It is shown that the algorithm improves the resulting peak shapes and is more efficient especially at low diffraction intensities, yielding a higher thickness resolution.
机译:目前,我们能够在AIXTRON 200 RF-S反应器中,使用市售的PANalytical Cu陶瓷管作为X射线源,在沉积过程中同时测量旋转样品上的原位X射线衍射和椭圆偏振光谱。由于旋转样本的自然摆动,因此在添加单个频谱之前使用了补偿算法,以提高拟合过程之前的信噪比。迄今为止,所使用的算法基于检测代表峰中心的峰最大值。在本文中,我们提出了一种基于对称峰形的改进补偿算法,该算法能够从重心计算峰对称轴。结果表明,该算法改善了所得峰形,并且在低衍射强度下更有效,从而产生了更高的厚度分辨率。

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