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首页> 外文期刊>Journal of Crystal Growth >Fabrication of GaN dot structure by droplet epitaxy using NH_3
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Fabrication of GaN dot structure by droplet epitaxy using NH_3

机译:使用NH_3通过液滴外延制造GaN点结构

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摘要

In GaN dots grown by droplet epitaxy using NH_3, the relation between growth temperature, and size, density, and degree of nitridation was investigated. As growth temperature increased from 390 to 700℃, both enlargement of dot size and a drop in dot density were observed, which seemed to be caused by both migration and evaporation of Ga atoms. In contrast, post-growth annealing at 700℃ under an NH_3 atmosphere for the sample grown at 520℃ had the effects of remarkably increasing dot density, reducing dot size, and improving nitridation of the grown dots. The mechanism of GaN dot growth by droplet epitaxy using NH_3 is discussed, and the effectiveness of the post-growth annealing under an NH_3 atmosphere is shown.
机译:在使用NH_3通过液滴外延生长的GaN点中,研究了生长温度与尺寸,密度和氮化度之间的关系。随着生长温度从390℃升高到700℃,观察到了点尺寸的增大和点密度的下降,这似乎是由Ga原子的迁移和蒸发引起的。相反,对于在520℃下生长的样品,在NH_3气氛下在700℃下进行生长后退火,具有显着提高点密度,减小点尺寸和改善生长点的氮化的效果。讨论了使用NH_3通过液滴外延生长GaN点的机理,并显示了在NH_3气氛下进行后生长退火的有效性。

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