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首页> 外文期刊>Journal of Crystal Growth >First-principles caclulations on atomic and electronic strucutres of misfit dislocaotions in InAs/GaAs(1 1 0) and InAs/GaAs(1 1 0) heteroepitaxies
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First-principles caclulations on atomic and electronic strucutres of misfit dislocaotions in InAs/GaAs(1 1 0) and InAs/GaAs(1 1 0) heteroepitaxies

机译:InAs / GaAs(1 1 0)和InAs / GaAs(1 1 0)异位错配位错原子和电子结构的第一性原理计算

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We investgiated the atomic and electronic structures of the misfit dislocatoins of InAs/GaAs(1 1 0) and InAs/GaAs(1 1 0) heteroniterfaces by first-principles calculations and scanning tunneling microscopy (STM). The calculated results show that the core confied at the InAs/GaAs(1 1 0) heterointerface has five-fold coordinated In atoms The surface just above the dislocation line was depressed and the calculated vertical displacement was about 0.52 A when the InAs epilayer thickness is 4 ML, which is in good agrement with the STM observations. In the InAs/GaAs heteroepitaxy, core strucutres drastically change with the increase of GaAs epilayer thickness.
机译:我们通过第一性原理计算和扫描隧道显微镜(STM)研究了InAs / GaAs(1 1 0)和InAs / GaAs(1 1 0)错配错配位错的原子和电子结构。计算结果表明,限制在InAs / GaAs(1 1 0)异质界面上的核具有五重配位的In原子。当InAs外延层厚度为0时,位错线正上方的表面被压低,计算出的垂直位移约为0.52A。 4 ML,与STM观察结果相符。在InAs / GaAs异质外延中,核心结构随着GaAs外延层厚度的增加而急剧变化。

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