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首页> 外文期刊>Journal of Crystal Growth >Molecular beam epitaxy grwoth of MgZnSSe/ZnSSe/CdZnSe microcavity light-emitting dioes using in situ reflectance monitoring
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Molecular beam epitaxy grwoth of MgZnSSe/ZnSSe/CdZnSe microcavity light-emitting dioes using in situ reflectance monitoring

机译:MgZnSSe / ZnSSe / CdZnSe微腔发光二极管分子束外延生长的原位反射监测

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摘要

Results on molecular beam epitaxy growth of MgZnSSe/ZnSSe/CdZnSe microcavity light-emitting diodes are reproeted. Satisfactory cotnrol of the cavity resoance and distributed Bragg reflector step band position is obtained using in situ refelctance measurement for the laeyr thickness monitoring. Microcavity light-emitting dioes show spectral emission width of 14-17 nm at 505-506 nm. A maximum wall-plug efficiency of 0.33/100 is measrued from a device with a 40-μm window diameter.
机译:MgZnSSe / ZnSSe / CdZnSe微腔发光二极管分子束外延生长的结果。使用原位反射率测量进行层厚监测,可获得空腔分辨率和分布的布拉格反射器阶跃带位置的令人满意的控制。微腔发光二极管在505-506 nm处显示14-17 nm的光谱发射宽度。窗口直径为40μm的设备测得的最大墙塞效率为0.33 / 100。

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