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Polycrystals growth on dielectric masks during InP/GaAs selective MOVPE

机译:InP / GaAs选择性MOVPE期间介电掩模上的多晶生长

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In selective-area metalorganic vapor-phase epitaxy, polycrystals are generated on masks of large area. The generation of such crystals should be avoided because they act as uncontrollable sink of film precursors. Although generation of polycrystals is sometimes associated with surface migration of a precursor on masks, our observation suggested that polycrystals are generated when the gas-phase concentration of a film precursor just above masks exceeds a critical value. Reducing either total pressure or partial pressure of the source gas suppressed generation of polycrystals, which is consistent with the gas-phase mechanism. The threshold of gas-phase precursor concentration for generation of polycrystals was investigated as a function of growth temperature and Ⅴ/Ⅲ ratio for both GaAs and InP. The threshold increased with temperature, that is to say, fewer polycrystals were observed at higher temperature. The threshold for InP was significantly larger than that for GaAs. This information is useful for designing mask patterns which do not generate polycrystals, and it helps to provide a detailed understanding of nucleation phenomena.
机译:在选择性区域金属有机气相外延中,多晶在大面积的掩模上产生。应该避免这种晶体的产生,因为它们充当了不可控制的薄膜前体沉。尽管多晶的生成有时与掩膜上的前驱体的表面迁移有关,但我们的观察表明,当掩膜上方的膜前驱体的气相浓度超过临界值时,就会生成多晶。降低原料气的总压或分压可以抑制多晶的产生,这与气相机理是一致的。研究了生成多晶的气相前驱物浓度阈值与生长温度和GaAs和InP的Ⅴ/Ⅲ比的关系。阈值随温度增加而增加,也就是说,在较高温度下观察到较少的多晶。 InP的阈值明显大于GaAs的阈值。该信息对于设计不会产生多晶的掩模图案很有用,并且有助于提供对成核现象的详细了解。

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